Publications
publications by categories in reversed chronological order. generated by jekyll-scholar.
2026
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Physics-Informed Neural Network-Assisted Compact Modeling for Process Variation in Non-volatile Capacitive Crossbar ArraysIn IEEE International Reliability Physics Symposium (IRPS), 2026Oral Presentation -
Machine Learning-Assisted Compact Modeling of AC Stress-Induced Bias Temperature Instability in Top-and Bottom-Gate Oxide Semiconductor-Channel Semiconductor TransistorsIEEE Transactions on Electron Devices, 2026
2025
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Machine Learning-Assisted Modeling of AC Stress Induced Bias Temperature Instability in Oxide Channel Transistors for 2T Gain Cell eDRAMIn IEEE International Reliability Physics Symposium (IRPS), 2025
2024
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Bias Temperature Instability Analysis of Oxide Power Transistors for BEOL On-chip Voltage Converter in Thermally-Constrained H3D SystemsIn IEEE International Electron Devices Meeting (IEDM), 2024