Publications

publications by categories in reversed chronological order. generated by jekyll-scholar.

2026

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    Physics-informed AI Accelerated Retention Analysis of Ferroelectric Vertical NAND: From Day-Scale TCAD to Second-Scale Surrogate Model
    Gyujun Jeong, S. Cho, M. Shon, and 14 more authors
    In IEEE International Compact Modeling Conference (ICMC), 2026
    Oral Presentation
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    Physics-Informed Neural Network-Assisted Compact Modeling for Process Variation in Non-volatile Capacitive Crossbar Arrays
    Gyujun Jeong, J. Kwak, M. Vadlamani, and 2 more authors
    In IEEE International Reliability Physics Symposium (IRPS), 2026
    Oral Presentation
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    Machine Learning-Assisted Compact Modeling of AC Stress-Induced Bias Temperature Instability in Top-and Bottom-Gate Oxide Semiconductor-Channel Semiconductor Transistors
    J. Kwak, S. Deng, C. Zhang, and 6 more authors
    IEEE Transactions on Electron Devices, 2026

2025

  1. ieee-xplore.svg
    Machine Learning-Assisted Modeling of AC Stress Induced Bias Temperature Instability in Oxide Channel Transistors for 2T Gain Cell eDRAM
    J. Kwak, C. Zhang, Gyujun Jeong, and 5 more authors
    In IEEE International Reliability Physics Symposium (IRPS), 2025

2024

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    Bias Temperature Instability Analysis of Oxide Power Transistors for BEOL On-chip Voltage Converter in Thermally-Constrained H3D Systems
    J. Kwak, J. Shin, S. Deng, and 4 more authors
    In IEEE International Electron Devices Meeting (IEDM), 2024